Connected Microscopy and AI: Improving Materials Characterization and Analysis

Explore how advancements in AI and Machine Learning are transforming microscopy-based image segmentation and materials characterization, enabling faster, standardized, and more accurate analysis of complex microstructures in batteries, electronics, alloys, and more. This presentation will highlight practical examples of AI-driven and connected workflows that enhance image processing, segmentation, and classification across optical, electron, and x-ray microscopy, delivering actionable insights to streamline processes and improve manufacturing quality.